{"created":"2023-05-15T12:05:23.056703+00:00","id":10040,"links":{},"metadata":{"_buckets":{"deposit":"6beba73b-05d9-476a-ac5f-c0b569ac9a0e"},"_deposit":{"created_by":3,"id":"10040","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"10040"},"status":"published"},"_oai":{"id":"oai:iwate-u.repo.nii.ac.jp:00010040","sets":["1515:1519"]},"author_link":["62333","62336","62335","62334"],"item_16_alternative_title_23":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Separation and Measurement of Overlapping Ellipse-Like Patterns by Least-Squares Method"}]},"item_16_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1987-06-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"6","bibliographicPageEnd":"1180","bibliographicPageStart":"1173","bibliographicVolumeNumber":"J70-D","bibliographic_titles":[{"bibliographic_title":"電子情報通信学会論文誌. D, 情報・システム"},{"bibliographic_title":"The Transactions of the Institute of Electronics, Information and Communication Engineers. D","bibliographic_titleLang":"en"}]}]},"item_16_date_6":{"attribute_name":"登録日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2010-12-21"}]},"item_16_description_12":{"attribute_name":"Abstract","attribute_value_mlt":[{"subitem_description":"画像解析において，重なり合う粒子状物体の画像から個々に粒子を分離し形状を計測する問題は基本的であるが，まだ十分に解明されていない．一般に，この種の問題は与えられた粒子塊パターンの輪郭情報と粒子の形状に関する制約条件を組み合わせて解くことが必要である．粒子が円状パターンの場合には有効な手法が与えられているが，その一般化であるだ円状パターンの場合に有効な手法はまだ確立されていない．本論文では，重なり合うだ円状粒子画像に対して粒子を個々に分離計測するための一つの解法を与えた．これは，重なり合う粒子塊パターンの輪郭線から個々のだ円状粒子に属する部分曲線の組を分離し，これに最小2乗法を適用して各だ円状粒子の形状パラメータを決定しようとするものである．本手法の有効性を確認するために行っただ円状粒子画像に対する適用実験では，良好な分離計測結果を得ることができた．","subitem_description_type":"Other"}]},"item_16_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"62335","nameIdentifierScheme":"WEKO"}],"names":[{"name":"WATANABE, Takashi"}]},{"nameIdentifiers":[{"nameIdentifier":"62336","nameIdentifierScheme":"WEKO"}],"names":[{"name":"TAKAHASHI, Wataru"}]}]},"item_16_publisher_14":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会"}]},"item_16_rights_18":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"copyright © 1987 IEICE"}]},"item_16_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"09135731","subitem_source_identifier_type":"ISSN"}]},"item_16_text_4":{"attribute_name":"著者(機関)","attribute_value_mlt":[{"subitem_text_value":"岩手大学工学部情報工学科"}]},"item_16_version_type_27":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"渡辺, 孝志"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"高橋, 渉"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-11-14"}],"displaytype":"detail","filename":"tieice-v70n6p1173-1180.pdf","filesize":[{"value":"1.3 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"tieice-v70n6p1173-1180.pdf","url":"https://iwate-u.repo.nii.ac.jp/record/10040/files/tieice-v70n6p1173-1180.pdf"},"version_id":"7be88117-4008-4ded-b7ee-d07cfd1e2663"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"最小2乗法による重なり合うだ円状パターンの分離計測","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"最小2乗法による重なり合うだ円状パターンの分離計測"}]},"item_type_id":"16","owner":"3","path":["1519"],"pubdate":{"attribute_name":"公開日","attribute_value":"2010-12-21"},"publish_date":"2010-12-21","publish_status":"0","recid":"10040","relation_version_is_last":true,"title":["最小2乗法による重なり合うだ円状パターンの分離計測"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-05-16T10:55:40.403462+00:00"}