| Item type |
学術雑誌論文 / Journal Article(1) |
| 公開日 |
2011-09-22 |
| タイトル |
|
|
タイトル |
Polarized XAFS study of Mg K-edge for MgB2 on ZnO |
| キーワード |
|
|
主題Scheme |
Other |
|
主題 |
Polarized XAFS |
| キーワード |
|
|
主題Scheme |
Other |
|
主題 |
Mg K-edge |
| キーワード |
|
|
主題Scheme |
Other |
|
主題 |
MgB2 film |
| キーワード |
|
|
主題Scheme |
Other |
|
主題 |
Superconductor |
| 資源タイプ |
|
|
資源タイプ識別子 |
http://purl.org/coar/resource_type/c_6501 |
|
資源タイプ |
journal article |
| 著者 |
Miyanaga, Takafumi
Kanno, Tomoe
Fujine, Yosuke
Araaki, Jun
Yoshizawa, Masahito
|
| 著者(機関) |
|
|
値 |
Department of Advanced Physics, Hirosaki University |
| 著者(機関) |
|
|
値 |
Department of Advanced Physics, Hirosaki University |
| 著者(機関) |
|
|
値 |
Faculty of Engineering, Iwate University |
| 著者(機関) |
|
|
値 |
Faculty of Engineering, Iwate University |
| 著者(機関) |
|
|
値 |
Faculty of Engineering, Iwate University |
| 登録日 |
|
|
日付 |
2011-09-22 |
| 書誌情報 |
Journal of Electron Spectroscopy and Related Phenomena
巻 184,
号 3-6,
p. 254-256,
発行日 2011-04-01
|
| ISSN |
|
|
収録物識別子タイプ |
ISSN |
|
収録物識別子 |
0368-2048 |
| Abstract |
|
|
内容記述タイプ |
Other |
|
内容記述 |
Polarization-dependent Mg K-edge XAFS study was carried out for MgB2 films epitaxially deposited by MBE method on ZnO single crystal. 50 and 150 nm MgB2 films were deposited on the O-plane side of the ZnO single crystal. The investigation for the O-plane side of ZnO is interesting because the local structure of MgB2 should be affected by Mg–O interaction on the ZnO. The results indicate that the structure of 50 nm MgB2 film was expanded in the a–b plane and compressed along the c-axis, but that of 150 nm MgB2 was relaxed on the ZnO surface and should be close to the MgB2 crystalline phase. |
| 出版者 |
|
|
出版者 |
Elsevier B.V. |
| 権利 |
|
|
権利情報 |
Copyright © 2010 Published by Elsevier B.V. |
| DOI |
|
|
関連タイプ |
isVersionOf |
|
|
識別子タイプ |
DOI |
|
|
関連識別子 |
10.1016/j.elspec.2010.10.008 |
| 著者版フラグ |
|
|
出版タイプ |
AM |
|
出版タイプResource |
http://purl.org/coar/version/c_ab4af688f83e57aa |
jesro-v184i3-6p254-256.pdf (208.6 kB)
