{"created":"2023-05-15T12:05:09.707013+00:00","id":9780,"links":{},"metadata":{"_buckets":{"deposit":"a215365d-508c-44c5-b291-d10eb90f3e14"},"_deposit":{"created_by":3,"id":"9780","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"9780"},"status":"published"},"_oai":{"id":"oai:iwate-u.repo.nii.ac.jp:00009780","sets":["1515:1519"]},"author_link":["60724","60726","60722","60723","60725"],"item_16_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-01-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicPageEnd":"4370","bibliographicPageStart":"4368","bibliographicVolumeNumber":"41","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Magnetics"}]}]},"item_16_date_6":{"attribute_name":"登録日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2009-09-10"}]},"item_16_description_12":{"attribute_name":"Abstract","attribute_value_mlt":[{"subitem_description":"The effect of very-low-frequency magnetic fields (VLFMF) on living biological cells was investigated using a highly sensitive mutagenesis assay method. A bacterial gene expression system for mutation repair (umu system) was used for the sensitive evaluation of damage in DNA molecules. Salmonella typhimurium TA1535/pSK1002 were exposed to VLFMF (20 kHz, 600 μT, and 60 kHz, 100 μT) in a specially designed magnetic field exposure chamber. The experimental results showed the possibility of applying the umu assay for sensitive and effective evaluation of damage in DNA molecules. No significant difference was observed in the umu gene expression intensity under exposure to magnetic field of 20 kHz, 600 μT, and 60 kHz, 100 μT.","subitem_description_type":"Other"}]},"item_16_publisher_14":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_16_relation_26":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/TMAG.2005.854837","subitem_relation_type_select":"DOI"}}]},"item_16_rights_18":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2005 IEEE"}]},"item_16_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0018-9464","subitem_source_identifier_type":"ISSN"}]},"item_16_text_4":{"attribute_name":"著者(機関)","attribute_value_mlt":[{"subitem_text_value":"Faculty of Engineering, Iwate University"},{"subitem_text_value":"Faculty of Engineering, Iwate University"},{"subitem_text_value":"Graduate School of Engineering, Tohoku University"},{"subitem_text_value":"Faculty of Engineering, Tohoku Gakuin University"},{"subitem_text_value":"Faculty of Engineering, Tohoku Gakuin University"}]},"item_16_version_type_27":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Igarashi, Akira"}],"nameIdentifiers":[{"nameIdentifier":"60722","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kobayashi, Koichiro"}],"nameIdentifiers":[{"nameIdentifier":"60723","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsuki, Hidetoshi"}],"nameIdentifiers":[{"nameIdentifier":"60724","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Endo, Ginro"}],"nameIdentifiers":[{"nameIdentifier":"60725","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Haga, Akira"}],"nameIdentifiers":[{"nameIdentifier":"60726","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-11-14"}],"displaytype":"detail","filename":"itm-v41n11p4368-4370.pdf","filesize":[{"value":"952.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"itm-v41n11p4368-4370.pdf","url":"https://iwate-u.repo.nii.ac.jp/record/9780/files/itm-v41n11p4368-4370.pdf"},"version_id":"5db3d262-32f7-4bea-9b13-31fd56b435db"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Mutation repairing gene","subitem_subject_scheme":"Other"},{"subitem_subject":"Salmonella typhimurium TA1535/pSK1002","subitem_subject_scheme":"Other"},{"subitem_subject":"umu assay","subitem_subject_scheme":"Other"},{"subitem_subject":"very-low-frequency magnetic field(VLFME)","subitem_subject_scheme":"Other"},{"subitem_subject":"β-galactosidase","subitem_subject_scheme":"Other"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Evaluation of damage in DNA molecules resulting from very-low-frequency magnetic fields by using bacterial mutation repairing genetic system","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Evaluation of damage in DNA molecules resulting from very-low-frequency magnetic fields by using bacterial mutation repairing genetic system"}]},"item_type_id":"16","owner":"3","path":["1519"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-09-10"},"publish_date":"2009-09-10","publish_status":"0","recid":"9780","relation_version_is_last":true,"title":["Evaluation of damage in DNA molecules resulting from very-low-frequency magnetic fields by using bacterial mutation repairing genetic system"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-05-16T11:57:42.985715+00:00"}